[Libre-soc-bugs] [Bug 763] New: Work on I/O Core Pad JTAG Tests

bugzilla-daemon at libre-soc.org bugzilla-daemon at libre-soc.org
Thu Jan 13 01:20:44 GMT 2022


            Bug ID: 763
           Summary: Work on I/O Core Pad JTAG Tests
           Product: Libre-SOC's first SoC
           Version: unspecified
          Hardware: PC
                OS: Linux
            Status: CONFIRMED
          Severity: enhancement
          Priority: ---
         Component: Source Code
          Assignee: lkcl at lkcl.net
          Reporter: andrey at technepisteme.xyz
                CC: libre-soc-bugs at lists.libre-soc.org
   NLnet milestone: ---

Separate bug for the work I did on the core/pad resource JTAG test code.
Was initially documented in bug #50 .

The work involved:
- Parse a dummy resource list (gpio, i2c, uart)
- Instantiate peripherals from the list
- Write basic unit tests for the peripherals
- Connect the peripheral pins to the JTAG BS chain
- Write unit tests to check the JTAG functionality (SAMPLE and EXTEST)

Latest code:

Currently this temporary wiki page is used for documenting the tests:
(I'll be adding the information on the pinmux block later this week)

One main issue with a unit test is remaining: 
The TDO data after an EXTEST (test case 1 and 3) does not match up with the ios
dictionary of signals (the signals corresponding to the BS chain shift

As I'm using the ios dictionary signals for the asserts (and comparing against
the expected test vector), the test is passing, but I don't know if the JTAG is
not being driven correctly, or something is affecting the shift register (or
clears it).

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